• DocumentCode
    1502389
  • Title

    Wiring Diagnostics Via \\ell _1 -Regularized Least Squares

  • Author

    Schuet, Stefan

  • Author_Institution
    Ames Res. Center, Intell. Syst. Div., NASA, Moffett Field, CA, USA
  • Volume
    10
  • Issue
    7
  • fYear
    2010
  • fDate
    7/1/2010 12:00:00 AM
  • Firstpage
    1218
  • Lastpage
    1225
  • Abstract
    A new method for detecting and locating wiring damage using time domain reflectometry with arbitrary input interrogation signals is presented. This method employs existing ℓ1 regularization techniques from convex optimization and compressed sensing to exploit sparsity in the distribution of faults along the length of a wire, while further generalizing and improving commonly used fault detection techniques based on sliding correlation and peak detection. The method´s effectiveness is demonstrated using a simulated example, and it is shown how Monte Carlo techniques are used to tune it to achieve specific detection goals, like a certain false positive error rate. Furthermore, the method is easily implemented by adapting readily available optimization algorithms to quickly solve large, high resolution, versions of this estimation problem. Finally, the technique is applied to a real data set, which reveals its impressive ability to identify a subtle type of chafing damage on real wire.
  • Keywords
    Monte Carlo methods; fault location; least squares approximations; time-domain reflectometry; wiring; Monte Carlo techniques; arbitrary input interrogation signals; compressed sensing; convex optimization algorithm; false positive error rate; fault detection techniques; l1 regularization techniques; l1-regularized least squares; peak detection; sliding correlation; time domain reflectometry; wiring damage detection; wiring diagnostics; Aging; Aircraft; Fault detection; Impedance; Least squares methods; Optimization methods; Reflection; Reflectometry; Wire; Wiring; Diagnostics; fault detection; inverse scattering; lossless media; sparsity; time domain reflectometry (TDR); wiring;
  • fLanguage
    English
  • Journal_Title
    Sensors Journal, IEEE
  • Publisher
    ieee
  • ISSN
    1530-437X
  • Type

    jour

  • DOI
    10.1109/JSEN.2009.2037823
  • Filename
    5471702