DocumentCode
1502397
Title
Time-resolved imaging of anodic arc root behavior during fluctuations of a DC plasma spraying torch
Author
Dorier, Jean-Luc ; Gindrat, Malko ; Hollenstein, Christoph ; Salito, Armando ; Loch, Michael ; Barbezat, Gérard
Author_Institution
EPFL, Centre de recherches en Phys. des Plasmas, Lausanne, Switzerland
Volume
29
Issue
3
fYear
2001
fDate
6/1/2001 12:00:00 AM
Firstpage
494
Lastpage
501
Abstract
The fluctuating behavior of a Sulzer Metco F4 DC plasma gun has been investigated by simultaneous measurement of the time dependencies of the are voltage and of images from the nozzle interior. An end-on imaging arrangement using a mirror and a mask in the optical path from the are to the camera allows visualization of the anodic arc attachment by strongly attenuating the bright emission from the are column. With the torch operating in the restrike mode, sequences of images have been acquired in synchronization with several typical features of the are voltage fluctuations showing that the attachment nature changes during a restrike cycle. Multiple attachments which coexist at least during the 1 μs exposure time of the camera have been evidenced and are interpreted as a continuous process of creation/vanishing of successive arc roots with a smooth transfer of the current from one to the other. The anode wear is shown to have a strong effect on the root position over the anode periphery, with a preference for attachment in eroded regions. The effects of operation parameters such as current, gas flow and injector type on the attachment nature and position are also presented
Keywords
arcs (electric); plasma arc spraying; plasma diagnostics; plasma fluctuations; plasma torches; DC plasma spraying torch; Sulzer Metco F4 DC plasma gun; anodic arc attachment; anodic arc root behavior; creation/vanishing; current; end-on imaging arrangement; fluctuations; gas flow; injector type parameters; mask; mirror; multiple attachments; nozzle interior; operation parameters; optical path; restrike mode; strong effect; time-resolved imaging; voltage fluctuations; Anodes; Cameras; Mirrors; Optical attenuators; Optical imaging; Plasma measurements; Stimulated emission; Time measurement; Visualization; Voltage;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/27.928947
Filename
928947
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