Title :
Design Optimization for Digital Circuits Built With Gate-All-Around Silicon Nanowire Transistors
Author :
Liu, Yuchao ; Huang, Ru ; Wang, Runsheng ; Zhuge, Jing ; Xu, Qiumin ; Wang, Yangyuan
Author_Institution :
Inst. of Microelectron., Peking Univ., Beijing, China
fDate :
7/1/2012 12:00:00 AM
Abstract :
The design optimization for digital circuits built with gate-all-around silicon nanowire transistors (SNWTs) is discussed in details. Based on the verified multiwire SNWT compact model with accurate parasitic capacitance and resistance modeling, the design consideration of SNWT digital circuits (SNWTCs) at a 16-nm technology node, such as the SNWT ring oscillator (SNWT-RO), is discussed with the optimization of key process and layout parameters in the multiwire SNWT. In order to reduce the parasitic components of SNWTs and improve SNWTCs´ performance (including delay, power, and layout area), process (including nanowire diameter and other related parameters) and layout parameters (including wire number per transistor and footprint width of SNWTs) should be carefully designed. Through design optimization, the total capacitance and parasitic resistance of the SNWT can be reduced by over 80% compared with nonoptimized parasitic components, which leads to more than 90% reduction of circuit-level delay and power. Furthermore, the design optimization is carried out for power-driven design and area-driven design, respectively. For each case, the SNWT-RO with fan-out of 1 loading and 4 loading is optimized with variable power supply voltage for optimization. The optimized layout parameters for power-driven design and area-driven design are obtained, which can provide useful guidelines for SNWTC design.
Keywords :
digital circuits; integrated circuit layout; nanowires; silicon; transistors; SNWT ring oscillator; SNWTC design; area-driven design; circuit-level delay; design optimization; digital circuits; footprint width; gate-all-around silicon nanowire transistors; key process; layout area; multiwire SNWT compact model; nanowire diameter; nonoptimized parasitic components; optimized layout parameters; parasitic capacitance; parasitic resistance; power-driven design; resistance modeling; size 16 nm; variable power supply voltage; wire number per transistor; Delay; Design optimization; Layout; Loading; Logic gates; Resistance; Delay; design optimization; digital circuit applications; layout area; power; ring oscillator (RO); silicon nanowire transistors (SNWTs);
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2012.2192479