Title :
Temperature Dependence of the Transconductance in Ballistic III–V QWFETs
Author :
Liu, Yang ; Luisier, Mathieu ; Lundstrom, Mark S.
Author_Institution :
IBM Res., Hopewell Junction, NY, USA
fDate :
6/1/2011 12:00:00 AM
Abstract :
The temperature dependence of the transconductance in III-V quantum well field-effect transistors is studied using 2-D ballistic device simulations. It is found that the experimental characteristics of the temperature-dependent transconductance are captured by considering ballistic transport only, with no electron-phonon scattering. While the temperature behavior of the transconductance mainly depends on the intrinsic properties of the III-V devices at low VDS it is strongly affected by the series resistances at high VDS. Hence, it will be shown that the transconductance at high VDS becomes less temperature dependent as the series resistance decreases.
Keywords :
III-V semiconductors; ballistic transport; field effect transistors; quantum well devices; 2D ballistic device simulation; ballistic III-V quantum well field-effect transistor; ballistic transport; intrinsic property; temperature-dependent transconductance; HEMTs; MODFETs; Resistance; Scattering; Temperature dependence; Temperature measurement; Transconductance; Ballistic transport; high-electron mobility transistors (HEMTs); injection velocity; metal–oxide–semiconductor field-effect transistors (MOSFETs); quantum confinement; transconductance;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2011.2129520