DocumentCode :
1503111
Title :
Temperature Dependence of the Transconductance in Ballistic III–V QWFETs
Author :
Liu, Yang ; Luisier, Mathieu ; Lundstrom, Mark S.
Author_Institution :
IBM Res., Hopewell Junction, NY, USA
Volume :
58
Issue :
6
fYear :
2011
fDate :
6/1/2011 12:00:00 AM
Firstpage :
1804
Lastpage :
1808
Abstract :
The temperature dependence of the transconductance in III-V quantum well field-effect transistors is studied using 2-D ballistic device simulations. It is found that the experimental characteristics of the temperature-dependent transconductance are captured by considering ballistic transport only, with no electron-phonon scattering. While the temperature behavior of the transconductance mainly depends on the intrinsic properties of the III-V devices at low VDS it is strongly affected by the series resistances at high VDS. Hence, it will be shown that the transconductance at high VDS becomes less temperature dependent as the series resistance decreases.
Keywords :
III-V semiconductors; ballistic transport; field effect transistors; quantum well devices; 2D ballistic device simulation; ballistic III-V quantum well field-effect transistor; ballistic transport; intrinsic property; temperature-dependent transconductance; HEMTs; MODFETs; Resistance; Scattering; Temperature dependence; Temperature measurement; Transconductance; Ballistic transport; high-electron mobility transistors (HEMTs); injection velocity; metal–oxide–semiconductor field-effect transistors (MOSFETs); quantum confinement; transconductance;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2011.2129520
Filename :
5755189
Link To Document :
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