Title :
Data transmission testing set
Author :
Boughtwood, J. E. ; Christie, T. A.
Author_Institution :
The Western Union Telegraph Company, New York, N. Y.
fDate :
3/1/1958 12:00:00 AM
Abstract :
A transmission testing set for high-speed data circuits is described. It is an electronic, transistorized device for laboratory use in the development of binary data transmission systems.
Keywords :
Distortion measurement; Electron tubes; Logic gates; Pulse measurements; Receivers; Switches; Testing;
Journal_Title :
Electrical Engineering
DOI :
10.1109/EE.1958.6445683
