DocumentCode
1503150
Title
Data transmission testing set
Author
Boughtwood, J. E. ; Christie, T. A.
Author_Institution
The Western Union Telegraph Company, New York, N. Y.
Volume
77
Issue
3
fYear
1958
fDate
3/1/1958 12:00:00 AM
Firstpage
232
Lastpage
235
Abstract
A transmission testing set for high-speed data circuits is described. It is an electronic, transistorized device for laboratory use in the development of binary data transmission systems.
Keywords
Distortion measurement; Electron tubes; Logic gates; Pulse measurements; Receivers; Switches; Testing;
fLanguage
English
Journal_Title
Electrical Engineering
Publisher
ieee
ISSN
0095-9197
Type
jour
DOI
10.1109/EE.1958.6445683
Filename
6445683
Link To Document