A probe for making near-field measurements with minimal disturbance: the optically modulated scatterer

Author

Liang, W. ; Hygate, G. ; Nye, J.F. ; Gentle, D.G. ; Cook, R.J.

Author_Institution

Div. of Electr. Sci., Nat. Phys. Lab., Teddington, UK

Volume

45

Issue

5

fYear

1997

fDate

5/1/1997 12:00:00 AM

Firstpage

772

Lastpage

780

Abstract

We describe an optically modulated scatterer as an electric-field probe for measuring radio-frequency and microwave fields. It has a high spatial resolution and the ability to operate very close to conducting and dielectric objects without appreciable distortion of the field to be measured. Thus, it can scan close to antennas and diffracting metal structures. We describe how the electric field is deduced from the measurements and present gain measurements and far-field patterns deduced from near-field scans of antennas. The results are tested by comparing them with those obtained by established measurement techniques

Keywords

antenna radiation patterns; antenna testing; electric field measurement; electromagnetic wave scattering; gain measurement; microwave measurement; optical modulation; probes; antenna measurement; conducting objects; dielectric objects; diffracting metal structures; dipole antenna; electric field probe; far-field patterns; gain measurements; high spatial resolution; measurement techniques; microwave field measurement; minimal field distortion; near-field measurements; near-field scans; optically modulated scatterer; radio-frequency field measurement; Antenna measurements; Dielectric measurements; Distortion measurement; Electric variables measurement; Gain measurement; Microwave measurements; Optical distortion; Optical modulation; Optical scattering; Probes;

fLanguage

English

Journal_Title

Antennas and Propagation, IEEE Transactions on

Publisher

ieee

ISSN

0018-926X

Type

jour

DOI

10.1109/8.575620

Filename

575620