Title :
Natural and artificial voids in insulation
Author_Institution :
General Electric Company, Schenectady, N. Y.
Abstract :
AHIGH VOLTAGE Schering bridge with broadband differential amplifier and cathode-ray oscillograph were used to check the onset and offset of ionization as well as the change in conduction caused by surface effects within the void.
Keywords :
Degradation; Discharges (electric); Insulation; Ionization; Liquids; Polyethylene; Voltage measurement;
Journal_Title :
Electrical Engineering
DOI :
10.1109/EE.1959.6445863
