• DocumentCode
    1504282
  • Title

    Experimental investigation of layer-by-layer metallic photonic crystals

  • Author

    Temelkuran, B. ; Altug, H. ; Ozbay, E.

  • Author_Institution
    Dept. of Phys., Bilkent Univ., Ankara, Turkey
  • Volume
    145
  • Issue
    6
  • fYear
    1998
  • fDate
    12/1/1998 12:00:00 AM
  • Firstpage
    409
  • Lastpage
    414
  • Abstract
    The authors have investigated the transmission properties and defect characteristics of layer-by-layer metallic photonic crystals. They have demonstrated experimentally that the metallicity gap of these crystals extends to an upper band-edge frequency, and no lower edge was detected down to 2 GHz. The defect structures built around these crystals exhibited high transmission peak amplitudes (100%) and high 𝒬 factors (2250). The crystals with low filling ratios (around 1-2%) were tested and were still found to possess metallic photonic crystal properties. These crystals exhibited high reflection rates within the metallicity gap and reasonable defect mode characteristics. A power enhancement factor of 190 was measured for the electromagnetic (EM) wave within planar cavity structures, by placing a monopole antenna inside the defect volume. These measurements show that detectors embedded inside a metallic photonic crystal can be used as frequently selective resonant cavity enhanced (RCE) detectors with increased sensitivity and efficiency when compared to conventional detectors
  • Keywords
    Q-factor; cavity resonators; crystal defects; light transmission; metallic superlattices; optical multilayers; photodetectors; photonic band gap; 2 GHz; defect characteristics; defect mode characteristics; defect structures; efficiency; electromagnetic wave; frequently selective resonant cavity enhanced detectors; high Q factors; high reflection rates; high transmission peak amplitudes; layer-by-layer metallic photonic crystals; low filling ratios; metallicity gap; monopole antenna; planar cavity structures; power enhancement factor; sensitivity; transmission properties; upper band-edge frequency;
  • fLanguage
    English
  • Journal_Title
    Optoelectronics, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2433
  • Type

    jour

  • DOI
    10.1049/ip-opt:19982471
  • Filename
    762382