• DocumentCode
    1504451
  • Title

    Detecting exitory stuck-at faults in semimodular asynchronous circuits

  • Author

    Liebelt, Michael J. ; Burgess, Neil

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Adelaide Univ., SA, Australia
  • Volume
    48
  • Issue
    4
  • fYear
    1999
  • fDate
    4/1/1999 12:00:00 AM
  • Firstpage
    442
  • Lastpage
    448
  • Abstract
    Beerel (1994) showed that semimodular asynchronous circuits are totally self-checking with respect to multiple output stuck-at faults that are nonexitory and nonsubstitutional. We show that, in circuits with atomic gate implementations, it is possible to ensure that all exitory multiple output stuck-at faults will cause the circuit to halt
  • Keywords
    asynchronous circuits; logic testing; atomic gate implementations; exitory stuck-at faults; multiple output stuck-at faults; self-checking; semimodular asynchronous circuits; Asynchronous circuits; Automatic testing; Circuit faults; Circuit testing; Clocks; Delay effects; Electrical fault detection; Fault detection; Logic gates; Sufficient conditions;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.762538
  • Filename
    762538
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1504451