Title :
Detecting exitory stuck-at faults in semimodular asynchronous circuits
Author :
Liebelt, Michael J. ; Burgess, Neil
Author_Institution :
Dept. of Electr. & Electron. Eng., Adelaide Univ., SA, Australia
fDate :
4/1/1999 12:00:00 AM
Abstract :
Beerel (1994) showed that semimodular asynchronous circuits are totally self-checking with respect to multiple output stuck-at faults that are nonexitory and nonsubstitutional. We show that, in circuits with atomic gate implementations, it is possible to ensure that all exitory multiple output stuck-at faults will cause the circuit to halt
Keywords :
asynchronous circuits; logic testing; atomic gate implementations; exitory stuck-at faults; multiple output stuck-at faults; self-checking; semimodular asynchronous circuits; Asynchronous circuits; Automatic testing; Circuit faults; Circuit testing; Clocks; Delay effects; Electrical fault detection; Fault detection; Logic gates; Sufficient conditions;
Journal_Title :
Computers, IEEE Transactions on
