• DocumentCode
    1504564
  • Title

    An analysis of some problems in managing virtual memory systems with fast secondary storage devices

  • Author

    Hartley, Stephen J.

  • Author_Institution
    Dept. of Comput. Sci., Virginia Univ., Charlottesville, VA, USA
  • Volume
    14
  • Issue
    8
  • fYear
    1988
  • fDate
    8/1/1988 12:00:00 AM
  • Firstpage
    1176
  • Lastpage
    1187
  • Abstract
    Some of the problems that are expected to be encountered in managing virtual memory systems using the newer-technology secondary storage devices are address. The difficulties that two proposed policies have in choosing the most economical program localities of reference to assign to primary memory are analyzed. K. Koh´s (1981) criterion for examining the cyclic locality interval (CLI) hierarchy of a program and choosing the least-cost pathway is examined. Koh´s criterion is designed for the case of a CLI containing a single inner CLI. The decision to descend the hierarchy is based on the cycle time of the outer CLI. If the outer CLI has two or more inner CLIs, it is possible for Koh´s criterion to indicate that it is more economical to descend to one of the inner CLIs without that actually being the case. Choosing which CLI to descend to requires knowledge of its duration, and this is not generally available to the memory management system. An attempt to use Koh´s criterion with the loop structure of a program in order to reduce space-time execution cost was not successful
  • Keywords
    storage allocation; storage management; virtual storage; cyclic locality interval; least-cost pathway; loop structure; memory management; secondary storage; space-time execution cost; storage allocation; virtual memory; Algorithm design and analysis; Central Processing Unit; Computer science; Costs; Helium; Memory management; Semiconductor memory; Solid state circuits; Space technology; Technology management;
  • fLanguage
    English
  • Journal_Title
    Software Engineering, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-5589
  • Type

    jour

  • DOI
    10.1109/32.7627
  • Filename
    7627