Title :
Measurement of timing jitter contributions in a dynamic test setup for A/D converters
Author :
Janik, Jean-Marie ; Bloyet, Daniel ; Guyot, Benoît
Author_Institution :
Philips Semicond., Caen, France
fDate :
6/1/2001 12:00:00 AM
Abstract :
The article provides a new method which permits one to separate and to obtain an accurate estimation of timing jitter contributions appearing in an analog-to-digital (A/D) converter dynamic common test setup. The results are obtained using coherent sampling configuration and are independent of quantization and nonlinearities of the converter
Keywords :
analogue-digital conversion; curve fitting; dynamic testing; electric noise measurement; integrated circuit testing; signal sampling; timing jitter; ADC dynamic test setup; coherent sampling configuration; curve fitting; double-channel acquisition; noise measurement; timing jitter contributions; Analog-digital conversion; Frequency conversion; Noise measurement; Quantization; Robustness; Sampling methods; Signal to noise ratio; Statistical analysis; Testing; Timing jitter;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
