Title :
Channel-Length-Dependent Transport Behaviors of Graphene Field-Effect Transistors
Author :
Han, Shu-Jen ; Chen, Zhihong ; Bol, Ageeth A. ; Sun, Yanning
Author_Institution :
IBM T.J. Watson Res. Center, Yorktown Heights, NY, USA
fDate :
6/1/2011 12:00:00 AM
Abstract :
This letter presents a detailed study of transport in graphene field-effect transistors (GFETs) with various channel lengths, from 5 μm down to 90 nm, using transferred graphene grown by chemical vapor deposition. An electron-hole asymmetry observed in short-channel devices suggests a strong impact from graphene/metal contacts. In addition, for the first time, we observe a shift of the gate voltage at the Dirac point in graphene devices as a consequence of gate length scaling. The unusual shift of the Dirac point voltage has been identified as one of the signatures of short-channel effects in GFETs.
Keywords :
chemical vapour deposition; field effect transistors; graphene; channel-length-dependent transport behavior; chemical vapor deposition; electron hole; gate length scaling; graphene contact; graphene field-effect transistor; metal contact; short-channel device; Copper; Dielectrics; Logic gates; Semiconductor device measurement; Substrates; Transistors; Chemical vapor deposition (CVD) graphene; Dirac point; graphene field-effect transistor (GFET); short-channel effect;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2011.2131113