• DocumentCode
    1505052
  • Title

    Body of revolution phi flip matrix and BOR-PATCH system matrix optimization

  • Author

    Shaeffer, John

  • Author_Institution
    Marietta Sci. Inc., GA, USA
  • Volume
    45
  • Issue
    5
  • fYear
    1997
  • fDate
    5/1/1997 12:00:00 AM
  • Firstpage
    902
  • Lastpage
    908
  • Abstract
    A new phi flip unit matrix is introduced into the body of revolution (BOR) system matrix theory which aides in the development of negative mode expressions for the impedance, admittance, voltage, current, and row matrices. A demonstration of the phi hip matrix provides a succinct proof of existing results for scattered fields using positive modes. The BOR-PATCH system matrix equation and its solution are then presented using the phi flip matrix to optimize the partition solution. It is shown that the Zeffective matrix is symmetric and may be computed using positive modes and that the row Reffective measurement matrix may be obtained directly from the transpose of the Veffective excitation column matrix. For this work, the entire polarization scattering matrix is the goal since the optimizations introduced operate better at this level of formulation
  • Keywords
    electric admittance; electric current; electric potential; electromagnetic wave polarisation; electromagnetic wave scattering; matrix algebra; matrix inversion; optimisation; BOR-PATCH system matrix optimization; admittance matrix; body of revolution system matrix theory; current matrix; excitation column matrix; impedance matrix; negative mode expressions; phi flip unit matrix; polarization scattering matrix; positive modes; row matrix; row measurement matrix; scattered fields; symmetric matrix; transpose matrix; voltage matrix; Admittance; Concurrent computing; Electromagnetic measurements; Electromagnetic scattering; Equations; Geometry; Impedance; Polarization; Symmetric matrices; Voltage;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/8.575645
  • Filename
    575645