• DocumentCode
    1505127
  • Title

    Solder Joint Reliability of SnAgCu Solder Refinished Components Under Temperature Cycling Test

  • Author

    Wang, Weiqiang ; Osterman, Michael ; Das, Diganta ; Pecht, Michael

  • Author_Institution
    Center for Adv. Life Cycle Eng., Univ. of Maryland, College Park, MD, USA
  • Volume
    1
  • Issue
    5
  • fYear
    2011
  • fDate
    5/1/2011 12:00:00 AM
  • Firstpage
    798
  • Lastpage
    808
  • Abstract
    SnAgCu (SAC) solder is being offered as a lead-free termination finish. SAC finish is obtained by dipping the terminals of components into molten SAC solder. However, the reliability of solder joints formed with SAC solder refinished components needs to be determined in order to evaluate the effects of the SAC solder refinishing process. In this paper, the strength of solder joints with SAC solder refinished thin small outline packages (TSOPs) was evaluated by the shear test. The reliability of solder joints formed with SAC solder refinished components, including TSOPs and resistors, was evaluated by a temperature cycling test. Original Sn finished components were used as a baseline for comparison. It was found that SAC solder refinishing increased solder joint strength. SAC solder refinishing decreased the fatigue life of solder joints of TSOPs and increased the fatigue life of resistors under temperature cycling conditions.
  • Keywords
    copper alloys; materials testing; mechanical strength; reliability; silver alloys; solders; tin alloys; SnAgCu; lead-free termination finish; resistor; shear test; solder joint reliability; solder joint strength; solder refinished component; temperature cycling test; thin small outline package; Copper; Lead; Reliability; Resistors; Soldering; Temperature measurement; Tin; Lead-free solder; refinishing; reliability; shear test; solder dipping; solder joint; temperature cycling; tin-silver-copper;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2010.2095273
  • Filename
    5756459