Time-resolved imaging of VUV emission from a He-Xe micro surface discharge

Author

Jeong, Heui Seob ; Seo, Jeong Hyun ; Yoon, Cha Keun ; Kim, Joong Kyun ; Whang, Ki-Woong

Author_Institution

Sch. of Electr. Eng., Seoul Nat. Univ., South Korea

Volume

27

Issue

1

fYear

1999

fDate

2/1/1999 12:00:00 AM

Firstpage

12

Lastpage

13

Abstract

A direct observation of two-dimensional, time dependent behavior of 147 nm and 173 nm vacuum ultra violet emission from a single surface discharge type AC plasma display panel cell were obtained using a gated, image intensified charge-coupled device (ICCD). The images on the ICCD are formed by a pinhole. The two lines show similar spatial profile but quite different temporal behavior

Keywords

CCD image sensors; gas mixtures; helium; plasma diagnostics; plasma displays; surface discharges; time resolved spectra; ultraviolet spectra; xenon; 147 nm; 173 nm; He-Xe; He-Xe micro surface discharge; VUV emission; gated image intensified charge-coupled device; pinhole; single surface discharge type AC plasma display panel cell; spatial profile; temporal behavior; time-resolved imaging; two-dimensional time dependent behavior; vacuum ultraviolet emission; Apertures; Cathodes; Electrodes; Fresnel reflection; Image intensifiers; Plasma displays; Plasma measurements; Resonance; Spatial resolution; Surface discharges;

fLanguage

English

Journal_Title

Plasma Science, IEEE Transactions on

Publisher

ieee

ISSN

0093-3813

Type

jour

DOI

10.1109/27.762997

Filename

762997