Title :
Closed-Form Expressions for the Maximum Transient Noise Voltage Caused by an IC Switching Current on a Power Distribution Network
Author :
Kim, Jingook ; Li, Liang ; Wu, Songping ; Wang, Hanfeng ; Takita, Yuzo ; Takeuchi, Hayato ; Araki, Kenji ; Fan, Jun ; Drewniak, James L.
Author_Institution :
Sch. of Electr. & Comput. Eng., Ulsan Nat. Inst. of Sci. & Technol., Ulsan, South Korea
Abstract :
Closed-form expressions for transient power distribution network (PDN) noise caused by an IC switching current are derived for a PDN structure comprised of traces with decoupling capacitors. Criteria for identifying a dominant decoupling capacitor for an impulse switching current are also proposed. The derived PDN noise expressions are validated with measurements of currents at both local and bulk capacitors, the PDN impedance, and the total voltage noise in an operating consumer device.
Keywords :
capacitors; integrated circuit noise; IC switching current; PDN impedance; PDN noise; PDN noise expressions; PDN structure; bulk capacitors; closed-form expressions; current measurements; decoupling capacitors; dominant decoupling capacitor; impulse switching current; maximum transient noise voltage; operating consumer device; power distribution network; total voltage noise; Capacitors; Closed-form solutions; Impedance; Integrated circuits; Noise; Switches; Transient analysis; Current measurement; design guideline; dynamic noise; power distribution network (PDN); switching current; target impedance; transient noise;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2012.2194786
