DocumentCode
1505528
Title
Feature-Extraction-Based Inspection Algorithm for IC Solder Joints
Author
Wu, Fupei ; Zhang, Xianmin
Author_Institution
Dept. of Mechantronics Eng., Shantou Univ., Shantou, China
Volume
1
Issue
5
fYear
2011
fDate
5/1/2011 12:00:00 AM
Firstpage
689
Lastpage
694
Abstract
In order to inspect solder joint defects of integrated circuit (IC) components on printed circuit boards (PCBs), an automatic optical inspection (AOI) algorithm is developed. Firstly, considering the shape of a solder joint and its optical reflection property, the IC solder joint is divided into several subregions, which are called shape features. Secondly, the digital features that are used to evaluate the solder quality of the subregions are expressed by the color, area, mass center, and continuous pixels. Thirdly, the logical features are developed according to the color distributions of the solder joint image and the relationships between different subregions and the types of solder joints. Finally, to evaluate the performance of the proposed algorithm, 137 PCBs with defects were inspected by an AOI system that integrates with the proposed algorithm. Inspection results show that solder joint defects of IC such as surplus solder, lacking solder, no solder, lead lift, lead bend, shift, and bridged and pseudo joints can be identified effectively.
Keywords
automatic optical inspection; electronic engineering computing; feature extraction; integrated circuits; printed circuits; solders; AOI algorithm; IC components; IC solder joints; PCB; feature-extraction-based inspection algorithm; integrated circuit components; performance evaluation; printed circuit boards; solder joint image; solder quality evaluation; Feature extraction; Inspection; Integrated circuits; Lead; Pixel; Shape; Soldering; Automatic optical inspection; digital feature; integrated circuit component; logical feature; shape feature; solder joint;
fLanguage
English
Journal_Title
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
2156-3950
Type
jour
DOI
10.1109/TCPMT.2011.2118208
Filename
5756647
Link To Document