TLP measurements for verification of ESD protection device response

This paper describes a simplified, yet general, TLP circuit and method called time domain transmission (TDT) mode testing. The TDT method differs from and is compared to time domain reflection (TDR) mode testing. Transmission line pulsers (TLPs) have been used for many years to calibrate diagnostics and provide precise high-voltage, high-current waveforms. The pulsers have been used to qualify the electrostatic discharge (ESD) response of ESD protection circuits and devices. TLP applications cover a wider range of uses beyond estimating the ESD susceptibility of device level protection circuits. TLPs have been used to certify many ESD suppression devices including: device level ESD protection circuits, metal oxide varistors (MOV), transorbs, composite voltage variable materials (VVM), diodes, spark gaps, and occasionally, even capacitors and resistors