DocumentCode :
1505746
Title :
TLP calibration, correlation, standards, and new techniques
Author :
Barth, Jon E. ; Verhaege, Koen ; Henry, Leo G. ; Richner, John
Author_Institution :
Barth Electron. Inc., Boulder City, NV, USA
Volume :
24
Issue :
2
fYear :
2001
fDate :
4/1/2001 12:00:00 AM
Firstpage :
99
Lastpage :
108
Abstract :
This paper describes a constant impedance transmission line pulse system with new measurement capabilities and improved accuracy. The paper enforces a broader look at transmission line pulse (TLP) data, beyond the I-V curves. Accurate TLP measurements and actual TLP/HBM device data are used to demonstrate dV/dt effects and HBM/TLP correlation and miscorrelation. Finally, a calibration method and standard TLP test method are presented for adaptation by the industry. This is necessary to provide correlation and repeatability of experimental data
Keywords :
calibration; correlation methods; electrostatic discharge; measurement standards; overvoltage protection; pulse generators; time-domain analysis; TLP calibration; TLP/HBM device data; accuracy; constant impedance transmission line pulse system; correlation; dV/dt effects; measurement capabilities; repeatability; standards; Calibration; Circuit testing; Electrostatic discharge; Impedance; Protection; Pulse measurements; Pulsed power supplies; Switches; System testing; Transmission line measurements;
fLanguage :
English
Journal_Title :
Electronics Packaging Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-334X
Type :
jour
DOI :
10.1109/6104.930960
Filename :
930960
Link To Document :
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