• DocumentCode
    1505746
  • Title

    TLP calibration, correlation, standards, and new techniques

  • Author

    Barth, Jon E. ; Verhaege, Koen ; Henry, Leo G. ; Richner, John

  • Author_Institution
    Barth Electron. Inc., Boulder City, NV, USA
  • Volume
    24
  • Issue
    2
  • fYear
    2001
  • fDate
    4/1/2001 12:00:00 AM
  • Firstpage
    99
  • Lastpage
    108
  • Abstract
    This paper describes a constant impedance transmission line pulse system with new measurement capabilities and improved accuracy. The paper enforces a broader look at transmission line pulse (TLP) data, beyond the I-V curves. Accurate TLP measurements and actual TLP/HBM device data are used to demonstrate dV/dt effects and HBM/TLP correlation and miscorrelation. Finally, a calibration method and standard TLP test method are presented for adaptation by the industry. This is necessary to provide correlation and repeatability of experimental data
  • Keywords
    calibration; correlation methods; electrostatic discharge; measurement standards; overvoltage protection; pulse generators; time-domain analysis; TLP calibration; TLP/HBM device data; accuracy; constant impedance transmission line pulse system; correlation; dV/dt effects; measurement capabilities; repeatability; standards; Calibration; Circuit testing; Electrostatic discharge; Impedance; Protection; Pulse measurements; Pulsed power supplies; Switches; System testing; Transmission line measurements;
  • fLanguage
    English
  • Journal_Title
    Electronics Packaging Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-334X
  • Type

    jour

  • DOI
    10.1109/6104.930960
  • Filename
    930960