DocumentCode :
1505776
Title :
Visualizing radical-surface interactions in plasma deposition processes: reactivity of SiH3 radicals with Si surfaces
Author :
Ramalingam, Shyam ; Maroudas, Dimitrios ; Aydil, Eray S.
Author_Institution :
Dept. of Chem. Eng., California Univ., Santa Barbara, CA, USA
Volume :
27
Issue :
1
fYear :
1999
fDate :
2/1/1999 12:00:00 AM
Firstpage :
104
Lastpage :
105
Abstract :
There is a need for improving our fundamental understanding of the radical surface interactions during plasma enhanced chemical vapor deposition of Si. Toward this goal, we have calculated the interaction energy between SiH3 radicals and various Si surfaces, and mapped the changes in this energy as a function of position on the surface. Application of this analysis to the SiH3 radical impinging on a variety of Si surfaces, coupled with detailed investigation of the radical impingement dynamics, proved valuable in understanding and visualizing the driving forces that determine the nature of the radical-surface interactions during plasma deposition of Si
Keywords :
free radical reactions; free radicals; plasma CVD; plasma chemistry; plasma-wall interactions; silicon compounds; surface chemistry; Si; Si surfaces; SiH3; SiH3 radicals; amorphous Si; driving forces; interaction energy; molecular dynamics; plasma deposition processes; plasma enhanced chemical vapor deposition; position dependence; radical impingement dynamics; radical-surface interactions; reactivity; silane; visualisation; Amorphous silicon; Atomic measurements; Chemicals; Plasma applications; Plasma chemistry; Plasma devices; Plasma displays; Surface discharges; Thin film transistors; Visualization;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/27.763067
Filename :
763067
Link To Document :
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