DocumentCode :
1505780
Title :
Nonlinear Induced Variance of Frequency Response Function Measurements
Author :
Schoukens, Johan ; Barbé, Kurt ; Vanbeylen, Laurent ; Pintelon, Rik
Author_Institution :
Dept. of Fundamental Electr. & Instrum. (ELEC), Vrije Univ. Brussel, Brussels, Belgium
Volume :
59
Issue :
9
fYear :
2010
Firstpage :
2468
Lastpage :
2474
Abstract :
This paper analyzes the variance of the estimated frequency response function (FRF) ĜBLA of the best linear approximation ĜBLA to a nonlinear system that is driven by random excitations. ĜBLA varies not only due to the disturbing measurement and process noise but also over different realizations of the random excitation because the nonlinear distortions depend on the input realization. It will be shown that the variance expression σBLA2 that is obtained in the linear framework can also be used to calculate the variance that is induced by the nonlinear distortions. This validates the common engineering practice, where the linear FRF methodology is often used under nonlinear conditions.
Keywords :
frequency response; function approximation; measurement systems; nonlinear distortion; nonlinear systems; FRF methodology; frequency response function measurement; linear approximation; nonlinear distortions; nonlinear induced variance; nonlinear system; random excitations; Model uncertainty; nonlinear systems; variance frequency response function (FRF);
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2009.2032967
Filename :
5291739
Link To Document :
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