DocumentCode :
1506543
Title :
Analysis of an octagonal micromachined horn antenna for submillimeter-wave applications
Author :
Hesler, Jeffrey L. ; Hui, Kai ; Dahlstrom, Robert K. ; Weikle, Robert M. ; Crowe, Thomas W. ; Mann, Chris M. ; Wallace, H. Bruce
Author_Institution :
Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
Volume :
49
Issue :
6
fYear :
2001
fDate :
6/1/2001 12:00:00 AM
Firstpage :
997
Lastpage :
1001
Abstract :
An analysis is presented of a new horn antenna, fabricated by a novel micromachining technique, that uses crystallographic etching of silicon and ultraviolet lithography of an ultra-thick photoresist (SU-8). The horn was found to have low cross-polarized field levels and a predicted Gaussian coupling efficiency of 92.5%. The horn shape is governed by the crystal planes of the silicon substrate and the thickness of the photoresist and has up to four independent design parameters that allow a wide range of antenna patterns. A design for the horn that yields symmetric beam patterns was investigated by computer analysis, microwave scale modeling, and measurements of a micromachined horn at 585 GHz. The major features of the 585-GHz beam patterns agree well with the computer-generated and scaled beam patterns. We have thus demonstrated a new micromachinable horn that has great potential for integration into array structures
Keywords :
antenna radiation patterns; antenna testing; computer aided analysis; crystallography; electrical engineering computing; etching; finite element analysis; horn antennas; micromachining; submillimetre wave antennas; ultraviolet lithography; 585 GHz; EHF; Gaussian coupling efficiency; Si; antenna measurements; antenna patterns; array structures; computer analysis; computer-generated beam patterns; crystal planes; crystallographic etching; finite element analysis; horn shape; independent design parameters; low cross-polarized field levels; microwave scale modeling; octagonal micromachined horn antenna; photoresist thickness; scaled beam patterns; silicon; silicon substrate; submillimeter-wave applications; symmetric beam patterns; ultra-thick photoresist; ultraviolet lithography; Antenna measurements; Crystallography; Etching; Horn antennas; Lithography; Micromachining; Pattern analysis; Resists; Shape; Silicon;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/8.931159
Filename :
931159
Link To Document :
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