• DocumentCode
    1506543
  • Title

    Analysis of an octagonal micromachined horn antenna for submillimeter-wave applications

  • Author

    Hesler, Jeffrey L. ; Hui, Kai ; Dahlstrom, Robert K. ; Weikle, Robert M. ; Crowe, Thomas W. ; Mann, Chris M. ; Wallace, H. Bruce

  • Author_Institution
    Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
  • Volume
    49
  • Issue
    6
  • fYear
    2001
  • fDate
    6/1/2001 12:00:00 AM
  • Firstpage
    997
  • Lastpage
    1001
  • Abstract
    An analysis is presented of a new horn antenna, fabricated by a novel micromachining technique, that uses crystallographic etching of silicon and ultraviolet lithography of an ultra-thick photoresist (SU-8). The horn was found to have low cross-polarized field levels and a predicted Gaussian coupling efficiency of 92.5%. The horn shape is governed by the crystal planes of the silicon substrate and the thickness of the photoresist and has up to four independent design parameters that allow a wide range of antenna patterns. A design for the horn that yields symmetric beam patterns was investigated by computer analysis, microwave scale modeling, and measurements of a micromachined horn at 585 GHz. The major features of the 585-GHz beam patterns agree well with the computer-generated and scaled beam patterns. We have thus demonstrated a new micromachinable horn that has great potential for integration into array structures
  • Keywords
    antenna radiation patterns; antenna testing; computer aided analysis; crystallography; electrical engineering computing; etching; finite element analysis; horn antennas; micromachining; submillimetre wave antennas; ultraviolet lithography; 585 GHz; EHF; Gaussian coupling efficiency; Si; antenna measurements; antenna patterns; array structures; computer analysis; computer-generated beam patterns; crystal planes; crystallographic etching; finite element analysis; horn shape; independent design parameters; low cross-polarized field levels; microwave scale modeling; octagonal micromachined horn antenna; photoresist thickness; scaled beam patterns; silicon; silicon substrate; submillimeter-wave applications; symmetric beam patterns; ultra-thick photoresist; ultraviolet lithography; Antenna measurements; Crystallography; Etching; Horn antennas; Lithography; Micromachining; Pattern analysis; Resists; Shape; Silicon;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/8.931159
  • Filename
    931159