DocumentCode :
1506665
Title :
Time-Step Considerations in Particle Simulation Algorithms for Coulomb Collisions in Plasmas
Author :
Cohen, Bruce I. ; Dimits, Andris M. ; Friedman, Alex ; Caflisch, Russel E.
Author_Institution :
Lawrence Livermore Nat. Lab., Livermore, CA, USA
Volume :
38
Issue :
9
fYear :
2010
Firstpage :
2394
Lastpage :
2406
Abstract :
The accuracy of first-order Euler and higher-order time-integration algorithms for grid-based Langevin equations collision models in a specific relaxation test problem is assessed. We show that statistical noise errors can overshadow time-step errors and argue that statistical noise errors can be conflated with time-step effects. Using a higher-order integration scheme may not achieve any benefit in accuracy for examples of practical interest. We also investigate the collisional relaxation of an initial electron-ion relative drift and the collisional relaxation to a resistive steady-state in which a quasi-steady current is driven by a constant applied electric field, as functions of the time step used to resolve the collision processes using binary and grid-based, test-particle Langevin equations models. We compare results from two grid-based Langevin equations collision algorithms to results from a binary collision algorithm for modeling electron-ion collisions. Some guidance is provided on how large a time step can be used compared to the inverse of the characteristic collision frequency for specific relaxation processes.
Keywords :
differential equations; plasma collision processes; plasma simulation; plasma transport processes; Coulomb collision; binary collision algorithm; characteristic collision frequency; collisional relaxation; electron-ion collision model; electron-ion relative drift; first-order Euler algorithm; grid-based Langevin equation; high-order time-integration algorithm; particle simulation algorithm; quasisteady current; statistical noise error; test-particle Langevin equation model; time-step consideration; Computational modeling; Drag; Equations; Laboratories; Plasma applications; Plasma density; Plasma properties; Plasma simulation; Steady-state; Testing; Algorithms; collision processes; computer applications; numerical analysis; particle collisions; plasmas;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2010.2049589
Filename :
5475281
Link To Document :
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