Title :
Virtually reducing product development time
Author :
Hogan, T. ; Heffernan, D.
Author_Institution :
Analog Devices, Limerick, Ireland
fDate :
6/1/2001 12:00:00 AM
Abstract :
The speed at which semiconductor products are introduced to the market-place is key to the competitive success of individual companies. The authors look at the test engineering aspect of the IC and describe how a `virtual test´ can be effectively applied to reduce the overall product development time
Keywords :
integrated circuit manufacture; product development; production engineering computing; production testing; virtual reality; IC manufacture; product development; product testing; semiconductor products; virtual test;
Journal_Title :
Manufacturing Engineer
DOI :
10.1049/me:20010309
