Thin-film power-density meter for millimeter wavelengths

Author

Lee, Karen A. ; Guo, Yong ; Stimson, Philip A. ; Potter, Kent A. ; Chiao, Jung-Chih ; Rutledge, David B.

Author_Institution

Div. of Eng. & Appl. Sci., California Inst. of Technol., Pasadena, CA, USA

Volume

39

Issue

3

fYear

1991

fDate

3/1/1991 12:00:00 AM

Firstpage

425

Lastpage

428

Abstract

A quasi-optical power density meter for millimeter and submillimeter wavelengths has been developed. The device is a 2-cm² thin-film bismuth bolometer deposited on a mylar membrane. The resistance responsivity is 150 Ω/W, and the time constant is 1 min. The meter is calibrated at DC. The bolometer is much thinner than a wavelength, and can thus be modeled as a lumped resistance in a transmission-line equivalent circuit. The absorption coefficient is 0.5 for 189-Ω/square film. The power-density meter has been used to measure absolute power densities for millimeter-wave antenna efficiency measurements. Absolute power densities of 0.5 mW/cm² have been measured to an estimated accuracy of 5%

Keywords

bolometers; microwave antennas; microwave measurement; power measurement; MM wave; absorption coefficient; antenna efficiency; millimeter wavelengths; mylar membrane; quasi-optical power density meter; resistance responsivity; subMM wave; submillimeter wavelengths; thin film Bi bolometer; time constant; transmission-line equivalent circuit; Antenna measurements; Bolometers; Density measurement; Electrical resistance measurement; Millimeter wave devices; Millimeter wave measurements; Power measurement; Thin film circuits; Transistors; Wavelength measurement;

fLanguage

English

Journal_Title

Antennas and Propagation, IEEE Transactions on

Publisher

ieee

ISSN

0018-926X

Type

jour

DOI

10.1109/8.76347

Filename

76347