Title :
A resistor-less bandgap reference with improved PTAT generator for ultra-low-power LSIs
Author :
Hong Zhang ; Dong Li ; Qing Wang ; Jie Zhang ; Chong Li ; Ruizhi Zhang
Author_Institution :
Dept. of Microelectron., Xi´an Jiaotong Univ., Xi´an, China
Abstract :
A resistor-less bandgap reference (BGR) for ultra-low power large-scale integrations (LSIs) is proposed in this paper. The BGR consists of a nano-ampere current reference circuit, a complementary-to-absolute-temperature (CTAT) voltage generator based on a diode connected MOSFET operating in subthreshold region, and a proportional-to-absolute-temperature (PTAT) voltage generator. A new topology that combines two mechanisms to generate PTAT voltage is proposed for the first stage of the PTAT generator, which can achieve higher slope in the voltage-temperature characteristics. Therefore, only 3 sub-stages are required in the PTAT generator, and both power dissipation and chip area can be reduced. The BGR is designed in a 0.35-μm CMOS process. Simulated results show that the BGR achieves a 1.1-V reference voltage with best temperature coefficient of 35 ppm/°C, while consuming only 40-nA under a 3.3 V power supply.
Keywords :
CMOS integrated circuits; MOSFET; large scale integration; low-power electronics; reference circuits; BGR; CMOS process; CTAT; PTAT; chip area; complementary-to-absolute-temperature voltage generator; diode connected MOSFET; improved PTAT generator; nanoampere current reference circuit; power dissipation; proportional-to-absolute-temperature voltage generator; resistor-less bandgap reference; size 0.35 mum; subthreshold region; ultra-low power large-scale integrations; ultra-low-power LSIs; voltage 1.1 V; voltage 3.3 V; voltage-temperature characteristics; CMOS integrated circuits; Generators; MOSFET; Photonic band gap; Power supplies; Temperature; Threshold voltage;
Conference_Titel :
Faible Tension Faible Consommation (FTFC), 2014 IEEE
Conference_Location :
Monaco
DOI :
10.1109/FTFC.2014.6828605