• DocumentCode
    1507512
  • Title

    Extended technique for complex permittivity measurement of dielectric films in the microwave region

  • Author

    Thomas, R. ; Dube, D.C.

  • Author_Institution
    Dept. of Phys., Indian Inst. of Technol., New Delhi, India
  • Volume
    33
  • Issue
    3
  • fYear
    1997
  • fDate
    1/30/1997 12:00:00 AM
  • Firstpage
    218
  • Lastpage
    220
  • Abstract
    An extended cavity resonance method using the TE10η mode is discussed for measuring complex permittivity of dielectric films and foils of flexible dimensions nondestructively. Working relations for dielectric parameters ε\´ and ε" are obtained on extending the validity of conventional cavity perturbation technique. Results of measurements performed on mylar are presented. The method is suitable for the determination of complex permittivity of dielectric thin films
  • Keywords
    cavity resonators; dielectric thin films; microwave measurement; permittivity measurement; TE10η mode; complex permittivity measurement; dielectric films; dielectric foils; extended cavity resonance method; microwave region; mylar; nondestructive method;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19970137
  • Filename
    575936
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1507512