DocumentCode
1507550
Title
Tolerance Limits for
-Out-of-
Systems With Exponentially Distributed Component Lifetimes
Author
Ferná, Arturo J.
Author_Institution
Dept. de Estadística e Investig. Operativa, Univ. de La Laguna, La Laguna, Spain
Volume
59
Issue
2
fYear
2010
fDate
6/1/2010 12:00:00 AM
Firstpage
331
Lastpage
337
Abstract
This paper deals with the problem of determining statistical tolerance limits for the time-to-failure of a k -out-of-n :F system from component life data. The lifetimes of the components are assumed to be s -independently and identically distributed exponential variates. On the basis of a random sample of components, exact β-content, and β-expectation s-tolerance limits for the system lifetime are provided, which are valid even when certain percentages of the smallest, and the largest component failure times are missing. The proportion of conforming systems in a large batch is assessed by constructing an appropriate s-tolerance limit. The results presented are extended to several distributions, including the Weibull case with an unknown scale parameter. An example concerning a system of water pumps for cooling a reactor is used for illustration. The proposed method of obtaining s -tolerance limits can be readily applied, and requires only minimal computational effort. Our perspective is particularly attractive when system test data are not available, or are very scarce. In many circumstances, component testing is also advantageous in terms of time and cost savings.
Keywords
Weibull distribution; exponential distribution; life cycle costing; reliability theory; statistical analysis; tolerance analysis; β-expectation; /3-content; Weibull case; exponential distribution; k-out-of- n system; random sample; statistical tolerance limit; Cooling; Environmental economics; Exponential distribution; Inductors; Life testing; Maximum likelihood estimation; Quality control; Reliability engineering; System testing; Weibull distribution; $k$ -out-of- $n$ :F systems; $beta$ -content and $beta$ -expectation $s$ -tolerance limits; Double censoring; Weibull distribution; exponential distribution;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.2010.2048661
Filename
5475443
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