• DocumentCode
    1507550
  • Title

    Tolerance Limits for k -Out-of- n Systems With Exponentially Distributed Component Lifetimes

  • Author

    Ferná, Arturo J.

  • Author_Institution
    Dept. de Estadística e Investig. Operativa, Univ. de La Laguna, La Laguna, Spain
  • Volume
    59
  • Issue
    2
  • fYear
    2010
  • fDate
    6/1/2010 12:00:00 AM
  • Firstpage
    331
  • Lastpage
    337
  • Abstract
    This paper deals with the problem of determining statistical tolerance limits for the time-to-failure of a k -out-of-n :F system from component life data. The lifetimes of the components are assumed to be s -independently and identically distributed exponential variates. On the basis of a random sample of components, exact β-content, and β-expectation s-tolerance limits for the system lifetime are provided, which are valid even when certain percentages of the smallest, and the largest component failure times are missing. The proportion of conforming systems in a large batch is assessed by constructing an appropriate s-tolerance limit. The results presented are extended to several distributions, including the Weibull case with an unknown scale parameter. An example concerning a system of water pumps for cooling a reactor is used for illustration. The proposed method of obtaining s -tolerance limits can be readily applied, and requires only minimal computational effort. Our perspective is particularly attractive when system test data are not available, or are very scarce. In many circumstances, component testing is also advantageous in terms of time and cost savings.
  • Keywords
    Weibull distribution; exponential distribution; life cycle costing; reliability theory; statistical analysis; tolerance analysis; β-expectation; /3-content; Weibull case; exponential distribution; k-out-of- n system; random sample; statistical tolerance limit; Cooling; Environmental economics; Exponential distribution; Inductors; Life testing; Maximum likelihood estimation; Quality control; Reliability engineering; System testing; Weibull distribution; $k$-out-of- $n$:F systems; $beta$ -content and $beta$ -expectation $s$ -tolerance limits; Double censoring; Weibull distribution; exponential distribution;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2010.2048661
  • Filename
    5475443