• DocumentCode
    1507588
  • Title

    Reliability estimation for PLC-type optical splitters

  • Author

    Hanafusa, H. ; Hanawa, F. ; Hibino, Y. ; Nozawa, T.

  • Author_Institution
    NTT Opto-Electron. Labs., Ibaraki, Japan
  • Volume
    33
  • Issue
    3
  • fYear
    1997
  • fDate
    1/30/1997 12:00:00 AM
  • Firstpage
    238
  • Lastpage
    239
  • Abstract
    An accelerated lifetest on PLC-type optical splitters is performed in damp heat environments with different temperatures and humidities. The Weibull distribution is used to analyse the times-to-failure of the splitters statistically. The activation energy of the failure is derived as 1.39 eV. The hazard rate of the splitters is estimated to be <0.6 fit over a period of 30 years at 25°C 90% RH
  • Keywords
    Weibull distribution; integrated optics; life testing; optical elements; reliability; PLC-type optical splitter; Weibull distribution; accelerated lifetest; activation energy; hazard rate; humidity effect; reliability; statistical analysis; temperature effect; time-to-failure;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19970138
  • Filename
    575956
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1507588