DocumentCode :
1507608
Title :
AlGaN/GaN HEMTs grown on SiC substrates
Author :
Binari, S.C. ; Redwing, J.M. ; Kelner, G. ; Kruppa, W.
Author_Institution :
Naval Res. Lab., Washington, DC, USA
Volume :
33
Issue :
3
fYear :
1997
fDate :
1/30/1997 12:00:00 AM
Firstpage :
242
Lastpage :
243
Abstract :
The fabrication and characterisation of AlGaN/GaN HEMTs grown on SiC substrates are described. These devices have a transconductance of 70 mS/mm and a gate breakdown voltage in excess of 100V. The HEMTs have a hard pinch-off with nearly ideal subthreshold characteristics. An f T of 6 GHz and an fmax of 11 GHz were measured for 1 μm gate length devices
Keywords :
III-V semiconductors; aluminium compounds; characteristics measurement; electron mobility; gallium compounds; power HEMT; 1 micron; 11 GHz; 6 GHz; AlGaN-GaN; HEMTs; SiC; gate breakdown voltage; gate length; hard pinch-off; nearly ideal subthreshold characteristics; transconductance;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19970122
Filename :
575959
Link To Document :
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