DocumentCode
1507702
Title
Arithmetic spectrum applied to fault detection for combinational networks
Author
Heidtmann, Klaus D.
Author_Institution
Dept. of Comput. Sci., Hamburg Univ., Germany
Volume
40
Issue
3
fYear
1991
fDate
3/1/1991 12:00:00 AM
Firstpage
320
Lastpage
324
Abstract
A method for the derivation of fault signatures for the detection of faults in single-output combinational networks is described. The approach uses the arithmetic spectrum instead of the Rademacher-Walsh spectrum. It is a form of data compression that serves to reduce the volume of the response data at test time. The price which is paid for the reduction in the storage requirements is that some of the knowledge of exact fault location is lost. The derived signatures are short and easily tested using very simple test equipment. The test circuitry could be included on the chip since the overhead involved is comparatively small. The test procedure requires a high-speed counter cycling at maximum speed through selected subsets of all input combinations. Hence, the network under test is exercised at speed, and a number of dynamic errors that are not testable by means of conventional test-set approaches will be detected
Keywords
combinatorial circuits; data compression; integrated circuit testing; logic testing; arithmetic spectrum; chip; data compression; dynamic errors; fault detection; fault signatures; high-speed counter; response data; single-output combinational networks; storage requirements; Arithmetic; Circuit faults; Computer science; Counting circuits; Decision trees; Fault detection; Information theory; Testing;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/12.76409
Filename
76409
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