Title :
Investigation on the Single Event Burnout Sensitive Volume Using Two-Photon Absorption Laser Testing
Author :
Darracq, Frédéric ; Mbaye, Nogaye ; Azzopardi, Stéphane ; Pouget, Vincent ; Lorfevre, Eric ; Bezerra, Françoise ; Lewis, Dean
Author_Institution :
IMS laboratory (CNRS UMR5218), University Bordeaux 1, Talence, France
Abstract :
The Single Event Burnout sensitive volume of power MOSFETs is investigated using the laser Two-Photon Absorption Technique. A first discussion about the efficiency of this technique is given.
Keywords :
Absorption; Laser beams; Lasers; Measurement by laser beam; Probes; Sensitivity; Substrates; Sensitive volume; Single Event Burnout; Two Photon Absorption; vertical power MOSFET;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2012.2192449
