A finite element method (FEM) analysis of a shielded velocity-matched Ti:LiNbO/sub 3/ optical modulator

Author

Kawano, Kenji ; Noguchi, Kazuto ; Kitoh, Tsutomu ; Miyazawa, Hiroshi

Author_Institution

NTT Opto-Electron. Lab., Kanagawa, Japan

Volume

3

Issue

10

fYear

1991

Firstpage

919

Lastpage

921

Abstract

Shielded velocity-matched Ti:LiNbO/sub 3/ Mach-Zehnder optical modulators are analyzed based on the second-order triangular-element quasi-transverse-electromagnetic finite element method. The relationship between the traveling-wave electrode thickness and the optimum overlaid layer thickness is numerically investigated. The modulation bandwidth of the shielded velocity-matched optical modulator is greatly improved by incorporating the traveling-wave electrode thickness into the design of the optimum overlaid layer thickness in the 1.5 mu m wavelength region.<>

Keywords

electro-optical devices; finite element analysis; light interferometers; lithium compounds; optical communication equipment; optical modulation; optical waveguides; titanium; 1.5 micron; Mach-Zehnder optical modulators; finite element method analysis; modulation bandwidth; optical waveguide; optimum overlaid layer thickness; second-order triangular-element quasi-transverse-electromagnetic finite element method; shielded velocity matched LiNbO/sub 3/:Ti optical modulator; traveling-wave electrode thickness; wavelength region; Bandwidth; Buffer layers; Electrodes; Finite element methods; Optical buffering; Optical films; Optical modulation; Optical waveguides; Substrates; Support vector machines;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/68.93262

Filename

93262