Electrooptic beam deflection using the leaky mode of a planar waveguide

Author

Himel, M.D. ; Shi, X. ; Hu, X.Q. ; Moharam, M.G. ; Guenther, K.H.

Author_Institution

Center for Res. in Electro-Opt. & Lasers, Univ. of Central Florida, Orlando, FL, USA

Volume

3

Issue

10

fYear

1991

Firstpage

921

Lastpage

923

Abstract

Electrooptic beam deflection using the leaky mode of a TiO/sub 2/ thin-film waveguide in optical contact with a LiNbO/sub 3/ crystal is discussed. Initial measurements yielded a deflection efficiency of 0.34 mrad/kV and suggest potential for more than an order of magnitude improvement. By depositing the waveguide directly onto the electrooptical crystal, a rugged miniature device that has the potential for high-speed operation and an angular deflection efficiency equal to or higher than that of currently available bulk devices can be fabricated. In addition to the strict tolerances on the coating thickness, the deposited films must have extremely low losses, a high refractive index, and be resistant to environmental effects.<>

Keywords

electro-optical devices; lithium compounds; optical deflectors; optical films; optical waveguides; titanium compounds; LiNbO/sub 3/ crystal; LiNbO/sub 3/-TiO/sub 2/; TiO/sub 2/ thin film waveguide; angular deflection efficiency; coating thickness; deflection efficiency; electrooptic beam deflection; electrooptical crystal; environmental effects; high-speed operation; leaky mode; losses; planar waveguide; refractive index; rugged miniature device; strict tolerances; Coatings; Electrooptic devices; Electrooptical waveguides; High speed optical techniques; Optical films; Optical planar waveguides; Optical refraction; Optical variables control; Optical waveguides; Planar waveguides;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/68.93263

Filename

93263