Title :
Analytical evaluation of dielectric breakdown test based on one-minute step-up method
Author :
Tsuboi, Toshihiro ; Takami, Jun ; Okabe, Shigemitsu ; Hirose, Hideo ; Tsuru, Kotaro
Author_Institution :
R&D Center, Tokyo Electr. Power Co., Yokohama, Japan
fDate :
10/1/2009 12:00:00 AM
Abstract :
The authors previously pointed out that the results of insulation tests based on the one-minute step-up method deviate from the "true values". In the present study, these deviations are evaluated by numerical simulations. These deviations were found to exist not only under limited conditions in numerical simulations but to exist fundamentally on the one-minute step-up test method. This should be taken into consideration when making actual insulation designs.
Keywords :
electric breakdown; insulation testing; dielectric breakdown test; insulation designs; insulation tests; numerical simulations; one-minute step-up method; Dielectric breakdown; Dielectrics and electrical insulation; Equations; History; Insulation testing; Insulator testing; Numerical simulation; Shape; Voltage; Weibull distribution; Power-frequency withstand voltage test, one-minute step-up method, reliability evaluation, Weibull distribution.;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TDEI.2009.5293952