DocumentCode :
1508427
Title :
Cyclic Stabilization of Electrodeposited Nickel Structural Films
Author :
Collins, James G. ; Wright, M. Clara ; Muhlstein, Christopher L.
Author_Institution :
Dept. of Mater. Sci. & Eng., Pennsylvania State Univ., University Park, PA, USA
Volume :
20
Issue :
3
fYear :
2011
fDate :
6/1/2011 12:00:00 AM
Firstpage :
753
Lastpage :
763
Abstract :
Tensile, room-temperature creep, and fatigue tests were conducted to determine the stability of the mechanical properties of electrodeposited films and to establish a unique strategy to reduce variation in micromachined devices made from them. Microcrystalline nickel films with columnar grains with a typical diameter of less than 1 μm and nanocrystalline films with 20-nm equiaxed grains were evaluated. While the tensile strengths of the films were higher than bulk forms of the material, the strength, strain to failure, and apparent elastic modulus were highly variable. Creep tests revealed that the films accumulated plastic strain rapidly at room temperature and that the apparent elastic modulus increased after exposure to stress. However, the response of the film was sensitive to the local deposition conditions. Fortunately, incremental-step fatigue tests demonstrated that the films cyclically hardened and that further changes in the elastic and plastic deformation responses do not occur after cyclic stabilization. As a result, cyclic stress strain curves and the transient stabilization behavior can be used to define a mechanical “burn-in” sequence for electrodeposited nickel films that will improve the stability and reproducibility of micromachined devices.
Keywords :
creep testing; elastic deformation; elastic moduli; electrodeposits; failure (mechanical); fatigue testing; grain size; hardening; mechanical stability; metallic thin films; micromechanical devices; nanostructured materials; nickel; plastic deformation; stress-strain relations; tensile testing; yield strength; Ni; creep testing; cyclic hardening; cyclic stabilization; elastic deformation; elastic modulus; electrodeposited nickel structural films; fatigue testing; grain structures; mechanical failure; mechanical properties; microcrystalline nickel films; micromachined devices; nanocrystalline films; plastic deformation; plastic strain; size 20 nm; stress-strain curves; temperature 293 K to 298 K; tensile strength; tensile testing; yield strength; Fatigue; Loading; Materials; Nickel; Strain; Stress; Testing; Fatigue; nickel; thin films;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2011.2140354
Filename :
5762307
Link To Document :
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