• DocumentCode
    1508514
  • Title

    Development of the spin-valve transistor

  • Author

    Monsma, D.J. ; Vlutters, R. ; Shimatsu, T. ; Keim, E.G. ; Mollema, R.H. ; Lodder, J.C.

  • Author_Institution
    MESA Res. Inst., Twente Univ., Enschede, Netherlands
  • Volume
    33
  • Issue
    5
  • fYear
    1997
  • fDate
    9/1/1997 12:00:00 AM
  • Firstpage
    3495
  • Lastpage
    3499
  • Abstract
    As the easiest experimental approach, GMR (giant magnetoresistance) is usually measured using the current in plane (CIP)-GMR. The spin-valve transistor has previously been presented as a spectroscopic tool to measure current perpendicular to the planes (CPP)-GMR. Hot electrons cross the magnetic multilayer base quasi-ballistically and the number reaching the collector depends exponentially on the perpendicular hot electron mean free path. Collector current changes of 390% at 77 K have already been measured. Apart from the substantial fundamental value, such properties may be useful for sensor applications. The electron energy range fills the gap between the Fermi surface transport in resistance measurements and other hot electron techniques such as spin polarised electron energy loss spectroscopy (SPEELS). The preparation problem of the spin-valve transistor and metal base transistor structures in general, the deposition of a device quality semiconductor on top of a metal, has now been tackled by bonding of two semiconductor substrates during vacuum deposition of a metal: an excellent bond is achieved at room temperature. TEM photos show a continuous buried metal film. Apart from preparation of various metal base transistor like structures, many other fields may benefit form this new technique
  • Keywords
    Fermi surface; bipolar transistors; buried layers; carrier mean free path; giant magnetoresistance; hot carriers; magnetic multilayers; magnetoresistive devices; semiconductor technology; transmission electron microscopy; 77 K; Co-Cu; Fermi surface transport; GMR; Si; TEM; collector current changes; continuous buried metal film; electron energy range; giant magnetoresistance; hot electrons; magnetic multilayer; metal base transistor like structures; metal base transistor structures; perpendicular hot electron mean free path; preparation; preparation problem; resistance measurements; room temperature; semiconductor substrates; sensor applications; spin-valve transistor; vacuum deposition; Bonding; Current measurement; Electrical resistance measurement; Electrons; Giant magnetoresistance; Magnetic multilayers; Magnetic sensors; Polarization; Spectroscopy; Surface resistance;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.619478
  • Filename
    619478