DocumentCode :
1508737
Title :
Self-tracking charge pump for fast-locking PLL
Author :
Chen, Yuanfeng ; Mak, Pui-In ; Zhou, Yangzhong
Author_Institution :
Inst. of Microelectron., Chinese Acad. of Sci., Beijing, China
Volume :
46
Issue :
11
fYear :
2010
Firstpage :
755
Lastpage :
757
Abstract :
Presented is a self-tracking charge pump (ST-CP) that can deliver a non-constant current over the output voltage range for a fast-locking phase-locked loop (PLL). It features a simple self-bias self-tracking architecture that can reduce, simultaneously, the PLL locking time and the current mismatch in charge and discharge phases. Experimentally verified in a 0.18 ??m CMOS process, the proposed ST-CP achieves 72% reduction of PLL locking time compared with the conventional one. The core occupies 30 ?? 60 ??m and draws 10 ??A at 1.8 V.
Keywords :
CMOS integrated circuits; charge pump circuits; phase locked loops; CMOS process; PLL locking time; current mismatch; fast-locking PLL; fast-locking phase-locked loop; nonconstant current; output voltage; self-bias self-tracking architecture; self-tracking charge pump; size 0.18 mum;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2010.3562
Filename :
5479699
Link To Document :
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