DocumentCode
1509125
Title
High-Performance Polymer Light-Emitting Diodes Based on a Gallium-Doped Zinc Oxide/Polyimide Substrate
Author
Chen, Sy-Hann ; Chen, Yu-Chyuan
Author_Institution
Dept. of Electrophys., Nat. Chiayi Univ., Chiayi, Taiwan
Volume
59
Issue
6
fYear
2012
fDate
6/1/2012 12:00:00 AM
Firstpage
1709
Lastpage
1715
Abstract
Conducting atomic force microscopy and scanning surface potential microscopy were used to study the surface electrical properties of gallium-doped zinc oxide (GZO) films on the nanoscale. GZO films on a polyimide (PI) substrate were prepared by pulsed laser deposition at various substrate temperatures. Our experimental results show a correlation between the local conductivity and work function (WF) and the gallium dopant concentration and the number of oxygen vacancies on the GZO surface. When the substrate temperature was approximately 150 °C, the root-mean-square roughness, the percent surface area of the conducting regions, and the mean WF on the GZO surface were 2.17 nm, 88.91%, and 4.74 eV, respectively. When the GZO/PI substrate was used as an anode material in a polymer light-emitting diode (PLED), the electroluminescence intensity was increased by nearly onefold compared with the standard PLED, which is based on a commercial-indium tin oxide/glass substrate.
Keywords
II-VI semiconductors; anodes; atomic force microscopy; electroluminescence; gallium; organic light emitting diodes; polymers; pulsed laser deposition; surface potential; surface roughness; thin film devices; wide band gap semiconductors; zinc compounds; CAFM; PLED; ZnO:Ga; conducting atomic force microscopy; dopant concentration; electroluminescence intensity; polymer light-emitting diode; pulsed laser deposition; root-mean-square roughness; scanning surface potential microscopy; surface electrical property; work function; Anodes; Conductivity; Rough surfaces; Substrates; Surface roughness; Surface topography; Temperature measurement; Conducting atomic force microscopy (CAFM); gallium-doped zinc oxide (GZO); polyimide (PI); polymer light-emitting diodes (PLEDs); scanning surface potential microscopy (SSPM); substrate temperatures;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2012.2191555
Filename
6195069
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