Title :
Switching characteristics of submicron dimension Permalloy sandwich films
Author :
Zhu, T. ; Shi, J. ; Nordquist, K. ; Tehrani, S. ; Durlam, M. ; Chen, E. ; Goronkin, H.
Author_Institution :
Phoenix Corp. Res. Lab., Motorola Inc., Phoenix, AZ, USA
fDate :
9/1/1997 12:00:00 AM
Abstract :
Submicron magnetoresistive sandwich cells of various sizes are fabricated and their magnetic properties are studied. A novel coupling mechanism of magnetostatic origin has been found to be mainly responsible for unique switching characteristics in cells with small length to width ratio
Keywords :
Permalloy; ferromagnetic materials; magnetic domains; magnetic force microscopy; magnetic hysteresis; magnetic multilayers; magnetic switching; magnetisation; magnetisation reversal; magnetoresistance; magnetoresistive devices; random-access storage; sputtered coatings; NiFeCo-Cu-NiFeCo; coupling mechanism; magnetic layer structure; magnetic properties; magnetoresistive random access memory; magnetostatic origin; small length to width ratio; submicron dimension Permalloy sandwich films; submicron magnetoresistive sandwich cells; switching characteristics; Couplings; Magnetic domains; Magnetic field measurement; Magnetic films; Magnetic force microscopy; Magnetic separation; Magnetic switching; Magnetization; Magnetostatics; Switches;
Journal_Title :
Magnetics, IEEE Transactions on
