DocumentCode :
1509363
Title :
Normal force reduction in electronic circuits
Author :
Stennett, Neil A. ; Ireland, Tim P. ; Campbell, David S.
Author_Institution :
Dept. of Electron. & Electr. Eng., Loughborough Univ. of Technol., UK
Volume :
14
Issue :
1
fYear :
1991
fDate :
3/1/1991 12:00:00 AM
Firstpage :
45
Lastpage :
49
Abstract :
Elevated temperature heat-aging tests were performed on dual cantilever beam gold-plated-over-nickel, phosphor bronze electrical contacts. The normal force provided by the beam was directly measured before and after heat aging. A series of curves relating change of normal force with time was obtained for the temperature range 100-200°C. These curves showed that the normal force reduces with time. The rate of this reduction was found to increase with elevated temperature. The results of the tests are used to develop an empirical relationship for the behavior of the normal force with time and temperature
Keywords :
ageing; electrical contacts; gold; nickel; tin alloys; 100 to 200 degC; Au-Ni-SnPFePbZn; dual cantilever beam; electrical contacts; empirical relationship; heat-aging tests; normal force; Aging; Circuit testing; Contacts; Electronic circuits; Force measurement; Performance evaluation; Phosphors; Resistance heating; Structural beams; Temperature;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/33.76509
Filename :
76509
Link To Document :
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