DocumentCode
1509591
Title
Time-wise increases in contact resistance due to surface roughness and corrosion
Author
Bryant, Michael D. ; Jin, Moulin
Author_Institution
Dept. of Mech. Eng., Texas Univ., Austin, TX, USA
Volume
14
Issue
1
fYear
1991
fDate
3/1/1991 12:00:00 AM
Firstpage
79
Lastpage
89
Abstract
To understand failure and estimate connector reliability, a connector model was made in which two mated rough copper surfaces were subjected to ingression and corrosive attack by atmospheric oxygen. The rough surface segments the connector contact area into many small discrete areas (a-spots) through which currents flow. The initial a-spot contact radii a e (formed as metal-to-metal bridges by mating surface heights on the two mating surfaces) was determined by the externally applied load, connector materials, geometry, and surface topography. Later, corrosive attack of the metallic surfaces cause the metallic contact radii to shrink and resistances to increase. Factors in the model that influence the corrosive process are environmental temperature, partial pressure of oxygen, and geometric factors associated with the contact. Resulting curves of contact resistance versus time are similar in trend and shape to experimentally measured curves. From time variations of contact resistance of the connector, methods for estimating the useful lifetime of electrical connectors are also given
Keywords
contact resistance; electric connectors; failure analysis; reliability; surface topography; a-spot contact; connector reliability; contact area; contact resistance; corrosion; corrosive attack; environmental temperature; externally applied load; failure; geometric factors; geometry; ingression; partial pressure; rough surface; surface roughness; surface topography; time variations; Atmospheric modeling; Bridges; Connectors; Contact resistance; Copper; Rough surfaces; Shape measurement; Surface resistance; Surface roughness; Surface topography;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/33.76514
Filename
76514
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