• DocumentCode
    1509796
  • Title

    A 10-bit 200-MS/s CMOS parallel pipeline A/D converter

  • Author

    Sumanen, Lauri ; Waltari, Mikko ; Halonen, Kari A I

  • Author_Institution
    Electron. Circuit Design Lab., Helsinki Univ. of Technol., Finland
  • Volume
    36
  • Issue
    7
  • fYear
    2001
  • fDate
    7/1/2001 12:00:00 AM
  • Firstpage
    1048
  • Lastpage
    1055
  • Abstract
    This paper describes a 10-bit 200-MS/s CMOS parallel pipeline analog-to-digital (A/D) converter that can sample input frequencies above 200 MHz. The converter utilizes a front-end sample-and-hold (S/H) circuit and four parallel interleaved pipeline component A/D converters followed by a digital offset compensation. By optimizing for power in the architectural level, incorporating extensively parallelism and double-sampling both in the S/H circuit and the component ADCs, a power dissipation of only 280 mW from a 3.0-V supply is achieved. Implemented in a 0.5-μm CMOS process, the circuit occupies an area of 7.4 mm2. The converter achieves a differential nonlinearity and integral nonlinearity of ±0.8 LSB and ±0.9 LSB, respectively, while the peak spurious-free-dynamic-range is 55 dB and the total harmonic distortion better than 46 dB at a sampling rate of 200 MS/s
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; comparators (circuits); high-speed integrated circuits; low-power electronics; parallel architectures; pipeline processing; sample and hold circuits; 10 bit; 280 mW; 3 V; CMOS parallel pipeline ADC; IF sampling; bootstrapped MOS switch; calibration; comparators; differential nonlinearity; digital offset compensation; double-sampling; front-end S/H circuit; high-speed ADC; integral nonlinearity; low power dissipation; op amp; output scrambling; parallel interleaved pipeline component; peak spurious-free-dynamic-range; total harmonic distortion; Analog-digital conversion; Bandwidth; CMOS process; Calibration; Circuits; Operational amplifiers; Pipeline processing; Power dissipation; Prototypes; Sampling methods;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.933460
  • Filename
    933460