DocumentCode :
1509911
Title :
IC Reliability and Test: What Will Deep Submicron Bring?
Author :
Hawkins, Chuck ; Baker, Kyri ; Butler, Kenneth M. ; Fiquera, J. ; Nicolaidis, Michael ; Rao, V.B. ; Roy, Ranjit ; Welsher, T.
Volume :
16
Issue :
2
fYear :
1999
Firstpage :
84
Lastpage :
91
Keywords :
Clocks; Consumer products; Face detection; Failure analysis; IEEE news; Integrated circuit testing; Manufacturing; Temperature; Thermal stresses; Weapons;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1999.765207
Filename :
765207
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1509911
