DocumentCode
1509911
Title
IC Reliability and Test: What Will Deep Submicron Bring?
Author
Hawkins, Chuck ; Baker, Kyri ; Butler, Kenneth M. ; Fiquera, J. ; Nicolaidis, Michael ; Rao, V.B. ; Roy, Ranjit ; Welsher, T.
Volume
16
Issue
2
fYear
1999
Firstpage
84
Lastpage
91
Keywords
Clocks; Consumer products; Face detection; Failure analysis; IEEE news; Integrated circuit testing; Manufacturing; Temperature; Thermal stresses; Weapons;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1999.765207
Filename
765207
Link To Document