DocumentCode
1509958
Title
Conduction in failing aluminum connections
Author
Aronstien, J.
Author_Institution
Protune Corp., Poughkeepsie, NY
Volume
14
Issue
1
fYear
1991
fDate
3/1/1991 12:00:00 AM
Firstpage
170
Lastpage
175
Abstract
Conduction in failing aluminum contacts was studied using oscilloscope observation of the current-voltage characteristics. Crossed wire and twisted pair contacts are used in these studies. The dual crossed wire configuration permits evaluation of the distribution of the conducting channels. Measurement of contact resistance as normal force is increased shows that there is little metallic contact established through the aluminum oxide by application of normal force alone. Conduction in these aluminum connections is found to be predominantly metallic, however, established and sustained by the electrical breakdown mechanism known as A-fritting. The metallic conductive channels formed by this mechanism deteriorate and open, causing frequent repetition of the breakdown process. The results indicate that there is likely to be only one conducting channel active at a time. Observations made on aluminum-aluminum twisted pair and twist-on connector splices demonstrate that the same mechanism is operative for these connections. The relationship of the results to behavior of failing aluminum connections is discussed
Keywords
alumina; aluminium; contact resistance; electric breakdown of solids; electrical contacts; insulating thin films; A-fritting; Al-Al2O3-Al; contact resistance; crossed wire contacts; current-voltage characteristics; dual crossed wire configuration; electrical breakdown mechanism; failing Al-Al contacts; metallic conductive channels; metallic contact; normal force; oscilloscope observation; repetitive breakdown process; twisted pair contacts; Aluminum oxide; Circuits; Connectors; Contacts; Electric breakdown; Force measurement; Heating; Oscilloscopes; Temperature; Wire;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/33.76527
Filename
76527
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