DocumentCode :
151014
Title :
Electrothermal modeling and characterization of SiC Schottky and silicon PiN diodes switching transients
Author :
Jahdi, Saeed ; Alatise, Olayiwola ; Alexakis, Petros ; Li Ran ; Mawby, Philip
Author_Institution :
Sch. of Eng., Univ. of Warwick, Coventry, UK
fYear :
2014
fDate :
14-18 Sept. 2014
Firstpage :
2817
Lastpage :
2823
Abstract :
Schottky diodes are known to have lower conduction and switching losses compared to PiN diodes, however, are prone to ringing in the output characteristics. In this paper, analytical models have been developed to calculate the turn-off switching energy of SiC Schottky and silicon PiN diodes. The models account for the reverse recovery current and diode voltage overshoot in the case of the PiN diode as well as the output oscillations for the Schottky diodes. PiN diodes during turn-off exhibit significant reverse current which increases with the switching rate and temperature whereas Schottky diodes exhibit output oscillations due to RLC resonance in the circuit. By combining these models with thermal networks derived from transient thermal impedance curves of the diodes, a fast and accurate method of predicting the temperature transient for different switching frequencies and electrical time constants has been developed. These models can be used by application engineers to predict the energy dissipation when designing converters and can take account of temperature and switching rate dependencies of the diodes.
Keywords :
Schottky diodes; elemental semiconductors; p-i-n diodes; semiconductor device models; silicon; silicon compounds; thermal analysis; transient analysis; wide band gap semiconductors; RLC resonance; Schottky diode switching transients; Si; SiC; analytical models; conduction losses; converter design; diode voltage overshoot; electrical time constants; electrothermal characterization; electrothermal modeling; energy dissipation; output oscillations; reverse recovery current; silicon PiN diode switching transients; switching frequencies; switching losses; switching rate dependency; temperature transient prediction; thermal networks; transient thermal impedance curves; turn-off switching energy; PIN photodiodes; Schottky diodes; Silicon; Silicon carbide; Switches; Temperature measurement; Transient analysis; Modeling; Power Devices; Silicon Carbide; Switching Energy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Energy Conversion Congress and Exposition (ECCE), 2014 IEEE
Conference_Location :
Pittsburgh, PA
Type :
conf
DOI :
10.1109/ECCE.2014.6953780
Filename :
6953780
Link To Document :
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