Symmetry detection by generalized complex (GC) moments: a close-form solution

Author

Shen, Dinggang ; Ip, Horace H S ; Cheung, Kent K T ; Teoh, Eam Khwang

Author_Institution

Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore

Volume

21

Issue

5

fYear

1999

fDate

5/1/1999 12:00:00 AM

Firstpage

466

Lastpage

476

Abstract

This paper presents a unified method for detecting both reflection-symmetry and rotation-symmetry of 2D images based on an identical set of features, i.e., the first three nonzero generalized complex (GC) moments. This method is theoretically guaranteed to detect all the axes of symmetries of every 2D image, if more nonzero GC moments are used in the feature set. Furthermore, we establish the relationship between reflectional symmetry and rotational symmetry in an image, which can be used to check the correctness of symmetry detection. This method has been demonstrated experimentally using more than 200 images

Keywords

image processing; symmetry; 2D images; GC moments; close-form solution; feature set; image symmetry; nonzero generalized complex moments; reflectional symmetry; rotational symmetry; symmetry detection correctness checking; Computer vision; Image segmentation; Inspection; Object detection; Object recognition; Pattern matching; Reflection; Robots; Shape; Sun;

fLanguage

English

Journal_Title

Pattern Analysis and Machine Intelligence, IEEE Transactions on

Publisher

ieee

ISSN

0162-8828

Type

jour

DOI

10.1109/34.765657

Filename

765657