DocumentCode
1510254
Title
Characteristic-impedance measurement error on lossy substrates
Author
Williams, Dylan F. ; Arz, Uwe ; Grabinski, Hartmut
Author_Institution
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Volume
11
Issue
7
fYear
2001
fDate
7/1/2001 12:00:00 AM
Firstpage
299
Lastpage
301
Abstract
This paper examines error caused by parasitic inductance in the characteristic impedance measured by the calibration comparison method on lossy silicon substrates.
Keywords
calibration; electric impedance measurement; measurement errors; microwave measurement; Si; calibration comparison method; characteristic impedance measurement error; lossy silicon substrate; parasitic inductance; Calibration; Dielectric loss measurement; Dielectric measurements; Dielectric substrates; Impedance measurement; Loss measurement; Measurement errors; Planar transmission lines; Silicon; Transmission line measurements;
fLanguage
English
Journal_Title
Microwave and Wireless Components Letters, IEEE
Publisher
ieee
ISSN
1531-1309
Type
jour
DOI
10.1109/7260.933777
Filename
933777
Link To Document