Title :
Characteristic-impedance measurement error on lossy substrates
Author :
Williams, Dylan F. ; Arz, Uwe ; Grabinski, Hartmut
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fDate :
7/1/2001 12:00:00 AM
Abstract :
This paper examines error caused by parasitic inductance in the characteristic impedance measured by the calibration comparison method on lossy silicon substrates.
Keywords :
calibration; electric impedance measurement; measurement errors; microwave measurement; Si; calibration comparison method; characteristic impedance measurement error; lossy silicon substrate; parasitic inductance; Calibration; Dielectric loss measurement; Dielectric measurements; Dielectric substrates; Impedance measurement; Loss measurement; Measurement errors; Planar transmission lines; Silicon; Transmission line measurements;
Journal_Title :
Microwave and Wireless Components Letters, IEEE
DOI :
10.1109/7260.933777
