Title :
Pad de-embedding in RF CMOS
Author :
Aktas, Adem ; Ismail, Mohammed
Author_Institution :
Dept. of Electr. Eng., Ohio State Univ., Columbus, OH, USA
fDate :
5/1/2001 12:00:00 AM
Abstract :
In this article, we discuss techniques for RF pad layout and de-embedding, a topic of great interest particularly for implementing radio frequency (RF) circuits in mainstream CMOS technology
Keywords :
CMOS integrated circuits; integrated circuit layout; integrated circuit measurement; RF CMOS integrated circuit; measurement technique; pad de-embedding; pad layout; Atherosclerosis; CMOS process; CMOS technology; Calibration; Foundries; Probes; Radio frequency; Semiconductor device measurement; Semiconductor device modeling; Testing;
Journal_Title :
Circuits and Devices Magazine, IEEE
