• DocumentCode
    1510304
  • Title

    Pad de-embedding in RF CMOS

  • Author

    Aktas, Adem ; Ismail, Mohammed

  • Author_Institution
    Dept. of Electr. Eng., Ohio State Univ., Columbus, OH, USA
  • Volume
    17
  • Issue
    3
  • fYear
    2001
  • fDate
    5/1/2001 12:00:00 AM
  • Firstpage
    8
  • Lastpage
    11
  • Abstract
    In this article, we discuss techniques for RF pad layout and de-embedding, a topic of great interest particularly for implementing radio frequency (RF) circuits in mainstream CMOS technology
  • Keywords
    CMOS integrated circuits; integrated circuit layout; integrated circuit measurement; RF CMOS integrated circuit; measurement technique; pad de-embedding; pad layout; Atherosclerosis; CMOS process; CMOS technology; Calibration; Foundries; Probes; Radio frequency; Semiconductor device measurement; Semiconductor device modeling; Testing;
  • fLanguage
    English
  • Journal_Title
    Circuits and Devices Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    8755-3996
  • Type

    jour

  • DOI
    10.1109/101.933786
  • Filename
    933786
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1510304