Title :
Planning step-stress life-test with a target acceleration-factor
Author :
Yeo, Kwee-Poo ; Tang, Loon-Ching
Author_Institution :
Nat. Univ. of Singapore, Singapore
fDate :
3/1/1999 12:00:00 AM
Abstract :
A sequential approach is presented to plan a multiple-steps step-stress accelerated life test (SSALT) with type-I censoring so as to achieve a pre-specified acceleration factor. An initial optimal plan for a simple SSALT, where one not only has to determine the optimum hold-time under low stress but also the optimum low stress level, is obtained by solving a constrained nonlinear program. A backward recursion scheme generates the subsequent optimal low-stress levels and hold-times for multiple-step SSALT. An illustration using a 3-step SSALT is presented. The relative efficiency of the 2-step and 3-step SSALT is investigated. A numerical example illustrates the method under 2-step and 3-step SSALT
Keywords :
failure analysis; life testing; planning; reliability; backward recursion scheme; constrained nonlinear program; hold-times; multiple-steps step-stress accelerated life test; optimum hold-time; optimum low stress level; target acceleration-factor; type-I censoring; Acceleration; Data analysis; Extrapolation; Life estimation; Life testing; Maximum likelihood estimation; Sequential analysis; Stress; Time factors;
Journal_Title :
Reliability, IEEE Transactions on